A Versatile , Stable Scanning Proximal Probe Microscope
نویسنده
چکیده
We present a novel scanning proximal probe microscope design utilizing a piezo-electric driven coarse positioning mechanism in x, y, and z, while maintaining relatively small lateral dimensions. The instrument is suitable for insertion into a dewar. The primary purpose of this work is to develop a stable yet versatile instrument in order to meet the signal averaging limitations imposed by low signal level measurements. We have implemented a near field scanning optical microscope (NSOM) with this system, whose key features include simultaneous detection of reflected and transmitted signals, unique 'center of mass' tip oscillator for shear force feedback, and overall microscope stability.
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